The QuickEdit Part Results View

What is it?

The Part Results View provides a simple table view of each device on each wafer of each lot that is loaded into QuickEdit. The view has one row for each device and columns for each identifying field (lotid, x location, etc.) and for each parametric and functional test. Columns for parametric tests contain the most recent test result, if any, for the row's device. Columns for functional tests contain the words "passed" and "failed", as appropriate. Results for multiple parametric tests are in the separate multiple parameter results view.

Data Sorting

The view can be re-sorted according to the value of a given column by clicking in that column on the first row (the row with the test names).

Data Editing

Editing is not yet available in the Part Result View, however the individual STDF records that are the source of all Part Result data can be edited in the Data File Records view.